IEEE C62.35-2010 pdf download IEEE Standard Test Methods for Avalanche -unction Semiconductor Surge-Protective Device Components
The resistance of the ABD component against specified chemical solvent shall be determined, Themanufacturer shall provide the data if it is required.
5.1.2.2 Solderability
The solderability of the area on lead wire or surface mount terminals that are required to be wetted byshall be determined.if required, any de-wetting characteristics Shall be determined and specified.NOTE-For test methods see IEC 60068-2-20 (1979-01) Ed.4.0[B6].
5123 Flammability
The flammability of ABD components shall be determined and specified.NOTE-For test methods see IEC 60695-2-2 (1991-05) Ed. 2.0 [B18], IEC 60695-2-13 (2000-10) Ed. 1.0 [B19]，IECTS 60695-2-20 (2004-02) Ed. 20[B20 and UL 94 Ed 5 (1996)[B29]
5.1.3 System conditions
The purpose of this clause is to determine system conditions where ABD components that conform to thisstandard may be applied.
5.1.3.1 Nominal system frequencies
ABD components may be applied in systems where the frequency is between zero (DC) and several CHzIse on a particular system would be dependant on the individual ABD component’ s capacitance andleakage current, and the system’ s ability to cope with the load presented by the ABD component.
5.1.3.2 Maximum continuous system voltage
It is recommended that he of the ABD components applied in a system should be greater than themaximum voltage encountered in the system’s normal operation over the operating temperature range.
5.1.3.3 Surge environment
It is recommended that the ABD component surge ratings should exceed the expected amplitude, waveshape and frequency of occurrence of surges in the system application over the expected system ambienttemperature range. If the AB) component is subject to other than normal application or service conditionthey may require special consideration in design, manufacture or application.
5.1.3.4 Temperature environment
It is recommended that the ABD component electrical ratings and characteristics, after temperature deratfor the expected ambient temperature range of the svstem, meet the system needs
IEEE C62.35-2010 pdf download
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