IEEE 993-1997 pdf download IEEE Standard for Test Equipment Description Language (TEDL)
1. Overview
1.1 Scope
This standard is intended to apply principally to Automatic Test Equipment (ATE) applications using Abbreviated Test Language for All Sytems (ATLAS) test programs. The standard may also apply to ATE applica-tions using non-ATLAS test programs.
1.2 Purpose
The purpose of this standard is to provide a definition of a Test Equipment Description Language (TEDL).The definition consists of syntax and semantic rules for the language together with examples of its use
1.3 Application
A TEDL model is a mechanism for describing the configuration and capability of a specific ATE (andadapter) and for facilitating the implementation of unit under test (UUT) orientated test programs on theATE.Specifically it describes;
9)The devices included in an ATE and the devices included in an adapter.
bHow these devices are interconnected within the ATE and within the adapter.c)What interfaces exist between the test station controller and the devices as well as between thedevices and an external connection.
dThe capabilities of the ATE devices and how these devices are programmed to provide the desiredtest functions.
TEDL is not intended to be a programming language. It is intended that it be used to establish a data struc-ture representing the ATE and adapter. Some of its data elements may be dynamic, requiring processing asthe state of the system changes.
The TEDL model fills the information gap between the ATLAS test program and the physical instrumentation
Compliance to this standard does not remove user responsibility for system compatibility at either the application or physical communication level. Although it is the intent of this standard to simplify the svstem integration, the user must be familiar with the characteristics of all the system components in order to configurean optimum ATE
1.4 Relationship to other documents
aIEEE Std 716-1995 and ARINC Specifcation 626-3-1995. The companion standards IEEE Std 716.1995 and ARINC Specification 626-3-1995 define the ATLAS test language that is used to writeATLAS test programs. TEDL provides all test system information necessary to perform automaticand manual resource allocation for ATLAS test programs.
Test resource control standards, A test resource control standard defines the physical, electrical, andlogical aspects of the control interface between the test station controller and an instrumment. The following control interfaces are supported by TEDL and are described in 3.3:
488.1
488.2
Ethernet
RS-232
VXI
IEEE Std 1226.2-1993. This standard specifes Ada packages that define general purpose test supC)port services and data types needed to complete the definition and implementation/application of theother IEEE ABBET component standards.
2. References
This standard shall be used in conjunction with the following publications. When the following standards aresuperseded by an approved revision, the revision will be considered for incorporation into this standard.
ARINC Specification 626-3-1995, Standard ATLAS Language for Modular Test.
EIA/TIA-232-E, Interface Between Data Terminal Equipment and Data Circuit-Terminating EquipmentEmploying Serial Binary Data Interchange.
IEEE Std 100-1996, The IEEE Standard Dictionary of Electrical and Electronics Terms (ANSI).”
IEEE Std 488.1-1987 (Reaff 1994), IEEE Standard Digital Interface for Programmable Instrumentation(ANSI)
IEEE Std 488.2-1992,IEEE Standard Codes, Formats, Protocols, and Common Commands for Use withIEEE Std 488.1-1987, IEEE Standard Digital Interface for Programmable Instrumentation (ANSI).
IEEE Std 716-1995,IEEE Standard Test Language for All Systems-Common Abbreviated Test Languagefor All Systems (C/ATLAS)
IEEE Std 771-1989,IEEE Guide to the Use of the ATLAS Specification (ANSI).-
IEEE Std 1155-1992,1EEE Standard VMEbus Extensions for Instrumentation: VXIbus (ANSI).
IEEE 993-1997 pdf download
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