IEEE 325-2002 pdf download IEEE Standard Test Procedures for Germanium Gamma-Ray Detectors
1.1 Scope
This standard applies to germanium radiation detectors that are used for the detection and high-resolutionspectrometry of gamma rays, rays, and charged particles that produce hole-electron pairs in the crystal lat-tice. Included are detector endcap and reentrant (Marinelli) beaker standards.
Measuremments that depend upon phonon production are outside the scope of this standard
1.2 Purpose
The purpose of this standard is to establish terminology and standard test procedures so they have the samemeaning to both manufacturers and users.
Not all tests described in this standard are mandatory, but tests that are used to specify performance shall beperformed in accordance with the procedures described herein.
2. References
This standard shall be used in conjunction with the following publications:
IEEE Std 194-1977.IEEE Standard Pulse Terms and Definitions.
IEEE Std 300-1988 (Reaff 1993), IEEE Standard Test Procedures for Semiconductor Charged-ParticleDetectors (ANSI).
IEEE Std 301-1988 (Reaff 1993), IEEE Standard Test Procedures for Amplifiers and Preamplifiers Usedwith Detectors of Ionizing Radiation (ANSI).
IEEE Std 759-1984 (Reaff 1990), IEEE Test Procedures for Semiconductor X-ray Energy Spectrometers(ANSI).
3. Definitions, symbols, and abbreviations and acronyms
3.1 Definitions
Of the following definitions, several are “distributed”; that is, terms are used that are themselves defined inother definitions in this clause.
3.1.1 active region: A region of a detector in which charge created by ionizing radiation contributes significantly to the output signal.
3.1.2 amplifier noise: See: noise referred to the input.
3.1.3 amplifier shaping time: A nonspecific indication of the shaped-pulse width issuing from a linear pulseamplifier.See: shaping index.
3.1.4 amplifier time constant: A misnomer for the width of the shaped pulse issuing from a linear pulseamplifier.See: shaping index.
3.1.5 avalanche breakdown: A breakdown caused by the cumulative multiplication of charge carriersthrough electric-field-induced impact ionization.
3.1.6 background (ambient): The spectrum of X or gamma rays originating from materials other than theradionuclide being measured.
3.1.7 background (under a peak): The background from all sources under a peak being measured, including Compton and degraded-energy counts from higher energy and ambient background events.
3.1.8 ballistic deficit: The loss in signal amplitude that occurs when the charge collection time in a detectoris a significant fraction of the amplifier’s differentiating time constant.
3.1.9 band gap: The energy difference between the bottom of the conduction band and the top of thevalence band.
3.1.10 baseline (of an electrical pulse): The average of the levels from which a pulse departs and to whichit returns in the absence of an overlapping pulse (IEEE Std 194-1977-)
3.1.11 baseline restorer (BLR): A circuit that rapidly restores the baseline following an amplifier’s outputpulse (or train of pulses) to the level that existed before the pulse.
3.1.12 bias, detector: The voltage applied to a detector to produce the electric field that sweeps out the signalcharge.
3.1.13 bias resistor: The resistor through which the bias voltage is applied to a detector.
IEEE 325-2002 pdf download
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