IEEE 1262-1995 pdf download IEEE Recommended Practice for QualiÞcation of Photovoltaic (PV) Modules
3.2 Overview of qualification test
The qualification-test sequence is illustrated in figure 1, Module qualification test requirements, whichprovide detailed guidance and minimum requirements for the overall qualification test, are given in clause 4.Requirements and evaluation of test results necessary for passing the qualification test are provided in 4.4.and include
aInitial tests and inspections
b)Sequence A through F tests and inspections which subject the modules to a specified sequence ofenvironments and stress
cFinal tests and inspections.
Descriptions of the required test and inspection procedures are provided in clause 5.
initial tests and inspections (see 5.2) establish selection and acceptance of as-received modules as testmodule specimens. They also establish baseline visual-inspection information and electrical-performancemeasurement data for comparison and determination of the effects on module physical characteristics andelectrical performance following exposure and endurance tests.
Nine test modules are required to complete all the specified tests. If the intrusive hot-spot test (sequence E)or intrusive bypass diode thermal test (sequence F) is to be performed, specially fabricated modules arerequired.
Test sequences A through F subject the modules to a specified sequence of environments and typical oraccelerated stresses similar to those which final deployed modules should survive (see 4.2).
The tests and inspections (see 4.3) provide data for comparison with initial test and inspection results.
The criteria for passing the qualification tests are provided in 4.4
4. Module test and evaluation requirements
This clause specifies the recommended tests and inspections to be performed and the required test sequenceto be followed to evaluate photovoltaic flat-plate modules. The required test sequence is illustrated in thefow diagram provided in figure 1 along with designated inspection and test identification numberscorresponding to inspections and test procedures specified in clause 5
4.1 Test specimens
A minimum of nine module test specimens of each module type representative of the modules to bedeployed in the field is required to conduct all the tests specified in this recommended practice if the non.intrusive hot-spot test and non-intrusive bypass diode thermal test are performed. lt should be noted that theuse of the non-intrusive hot-spot test permits elimination of test sequence E and use of the non-intrusiveypass diode thermal test eliminates test sequence F The modules should be randomly selected from aproduction batch or identical batches manufactured to the standard procedures and drawings, and approvedby the manufacturer’s quality control and conform to its acceptance procedures. Modules should not be preconditioned, e.g, light soaked or subject to other special procedures that are not a part of standardproduction. When the intrusive hot-spot test is to be conducted, an additional test module should be speciallyfabricated with leads brought out for accessing individual cells. When the intrusive bypass diode test is to be
IEEE 1262-1995 pdf download
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