IEEE 1241-2000 pdf download IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
1.1 Scope
The material presented in this standard is intended to provide common terminology and testmethods for the testing and evaluation of analog-to-digital converters (ADCs). This standardconsiders only those ADCs whose output values have discrete values at discrete times, i.e.they are quantized and sampled. In general, this quantization is assumed to be nominallyuniform (the input-output transfer curve is approximately a straight line) as discussed further inl.3, and the sampling is assumed to be at a nominally uniform rate. Some but not all of thetest methods in this standard can be used for ADCs that are designed for non-uniformquantization
This standard identifies ADC error sources and provides test methods with which to perform therequired error measurements. The information in this standard is useful both to manufacturers and tousers of ADCs in that it provides a basis for evaluating and comparing existing devices, as well asproviding a template for writing specifications for the procurement of new ones. In some applications.the information provided by the tests described in this standard can be used to correct ADC errors.e.g., correction for gain and offset errors.
The reader should note that this standard has many similarities to IEEE Std 1057-1994. Many ofthe tests and terms are nearly the same, since ADCs are a necessary part of digitizing waveformrecorders
1.2 Analog-to-digital converter background
This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. Although dierent methods exist for representing a continuous analog signal as a discrete sequence of binary words, an underlying model implicit in many of the tests in this standard assumes that the relationship between the input signal and the output values approximates the staircase transfer curve depicted in Figure 1a. Applying this model to a voltage-input ADC, the full-scale input range (FS) at the ADC is divided into uniform intervals, known as code bins, with nominal width Q. The number of code transition levels in the discrete transfer function is equal to 2 N À1, where N is the number of digitized bits of the ADC. Note that there are ADCs that are designed such that N is not an integer, i.e., the number of code transition levels is not an integral power of two. Inputs below the rst transition or above the last transition are represented by the most negative and positive output codes, respectively. Note, however, that two conventions exist for relating V min and V max to the nominal transition points between code levels, mid-tread and mid-riser.

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