IEEE 1505.1-2008 pdf download IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
1.2 Purpose
Standardization of a common input/output (I/0) will enable the interoperability of IEEE 1505 compliantinterface fixtures also known as interface test adaplers (ITA), inlerface devices (IDs), or inlerconnectingdevices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
1.3 Statement of the problem
1.3.1 U.S.Government guidance
From 1980 to 1992, the U.S. Department of Defense (DoD) investment in field, depot, and factoryautomatic test systems (ATS) exceeded $35 billion with an additional $15 billion for associated supportMost of this test capability was acquired as part of individual weapon system procurements. This led to aproliferation of different custom equipment types with unique interfaces. Recent policy decisions havechanged the direction of the purchase of test equipment towards a standards based approach with bothhardware and software critical interface requirements.
The U.S. DoD Instruction 5000.2-R1 ATS Policy states: “ATS capabilities shall be defined through criticalhardware and software elements (see (B2]). This policy however, did not deline these critical elementsThe Critical Interfaces Project was created to define critical ATS elements.
1.3.2 Critical Interfaces Project
The Factory-to-Field Integration of Defense Test Systems Project(commonly referred to as the CrificalWorking Group(CIWG)Interfaces Project) was started in the latter part of 1995.The Critical Interfaceswithin the Joint-Service ATS Research and Development Integrated Product Team (ARl) was establishedto perform the project. The ATS Executive Agent Office (EAO) has provided project anagement andcoordination among the Air Force, Army, Marine Corps, and Navy participants. In addition, many industryrepresentatives have participated. The CIWG published their findings in the Automatic Test SystemCritical Interfaces Report Bl] and this report served as the basis for the development of the RFIarchitecture and subsequent specification
The objective of the Critical Interfaces Project was to demonstrate the feasibility of reducing the cost to rehost test program sets (TPSs) and increase the interoperability of TPS sofware among the military servicesby using standardized interfaces
Interfaces that offer the potential to achieve this objective are deemed critical. Potential savings will bequantified through demonstration. The Automatic Test System Critical Interfaces Report (Bl] is maintainedby the ATS EAO and provides guidance to DoD ATE acquisition programs. This document also addressedthe requirements of DoD Regulation 5000.2-R1 (B2] and assisted in migrating the DoD designated testerfamilies towards a common solution. The Hardware Interfaces (HI) Subcommittee of the IEEE StandardsCoordinating Committee on Test and Diagnosis for Electronic Systems (SCC20) applied therecommendations of the report as it related to the RFl, to the extent that the current RFI standard is in fullcompliance with the report.
1.3.3 CTIWG guidance recommendations
During the Common Test Interface Working Group (CTIWG) October 2003 meeting, the DoD providedthe following recommendations as guidance for the Working Group’s success:
IEEE 1505.1-2008 pdf download
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