IEEE 1641-2004 pdf download IEEE Standard for Signal and Test Definition
、This standard is divided into seven clauses:
— Clause 1 provides an introduction to this standard.
— Clause 2 provides definitions of terms and lists abbreviations.
— Clause 3 describes the structure of the STD standard.
— Clause 4 specifies the signal modeling language (SML).
— Clause 5 specifies the STD basic signal components (BSCs).
— Clause 6 defines the test signal frameworks (TSFs).
— Clause 7 describes the test procedure language (TPL) layer.
This standard also contains the following annexes:
a) Annex A provides the Signals Modeling Language that is used to construct the BSCs and the TSFs.
b) Annex B provides BSC descriptions.
c) Annex C provides dynamic signal model description, states, and state transitions.
d) Annex D provides the interface definition language (IDL) description for the BSCs.
e) Annex E provides a TSF. This framework provides a formal description of signals similar to the signals defined in IEEE Std 716-1995. It also serves to illustrate how complex test signal models can be built up from BSCs.
f) Annex F provides the IDL description for the TSF provided in Annex E .
g) Annex G defines the requirements for a carrier language.
h) Annex H provides the formal TPL description.
i) Annex I provides the extensible markup language (XML) description mapping signal models into XML descriptions.
j) Annex J provides XML description mapping the TSF provided in Annex E into XML descriptions.
k) Annex K provides a description of how ATLAS nouns and noun modifiers are supported by STD.
l) Annex L provides a bibliography of related documents.
1.2 Purpose
The purpose of this standard is to provide a common signal reference for use throughout the life cycle of aunit under test (UUT) or test system. Such a reference will in turn facilitate information transfer. test reuseand broader application of test information-accessible through commercially available development tools.
2. Definitions, abbreviations, and acronyms
2.1 Definitions
For the purposes of this document, the following terms and definitions apply. The Authoritative DictionaryofIEEE Standards Terms (B8] should be referenced for terms not defined in this clause.
2.1.1 Abbreviated Test Language for All Systems (ATLAS): A stylized, abbreviated English languageused in the preparation and documentation of test requirements and test programs, which can be implemented either manually or with automatic or semmi-automatic test equipment.
2.1.2 argument: Input values that can be passed to a function
2.1.3 attribute: A property value that is used to define signal characteristics or behaviour.
IEEE 1641-2004 pdf download
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