IEEE 1532-2002 pdf download IEEE Standard for In-System Configuration of Programmable Devices
3.1.4 blank: Programmable devices usually contain one or several arrays of memory locations. The dataplaced in these locations constitute the device program. Many devices are asymmetrical with respect towriting data into these locations. For example, a “]may be written into a location containing a “0”, but notvice-versa. Thus, a “blank” device is filled with a field of overwriteable states. For symmetrically writeabledevices, the “blankstate is usually defined as a field of states that implement no programmablefunctionality. See also: device program.
3.1.5 burn time: An interval of time during which a set (or subset) of device programming bits is presentedto on-chip programming functions, which become the definition of the logic functions the device will subsequently implement In some older technologies, tiny on-chip fuses are vaporized (hence the term burn)which requires a minimum time to achieve. Burn time is technology dependent and may be nearly instantaneous in some devices or require many milliseconds in others. Synonyms include bake time, cook time, andsoak time.
3.1.6 chain: Two or more lEEE Std 1149.1-2001-compliant devices that share common test clock (TCK) andtest mode (TMS) signals and are linked together with the test data out (TDO) signal of one device connectedto the test data in (TDI) signal of a subsequent device. The overall chain may be accessed by a 4 or 5-wire testaccess port (TAP). See also: test access port (TAP)
3.1.7 checksum: This integer is created by a mathematical process that operates on a stream of data. Theinteger for this data is then published so that it can be compared to subsequently recalculated integers forthat same data. If the data have not been changed or disturbed, the published integer should match a newlycalculated integer.The mathematical process is often based upon binary addition (to some modulus) or logical Exclusive OR of bytes or words. There are wel-known flaws with such processes that can allowdamaged data streams to masquerade as good by having the same checksum. See also: CRC cyclic redun:dant codes.
3.1.8 completion: In the context of an ISC instruction, this process occurs when the sequence of activitiesperformed during execution has finished. However, the requirements for execution may not be met, or errorconditions may be encountered such that successful completion is not possible. These events constituteunsuccessful completion.See also: Execute
3.1.9 complex programmable logic device (CPLD): A high-capacity programmable logic device (PLD)usually provided in packages with 40 or more pins, essentially an array of programmable logic blocks interconnected by a routine matrix.
3.1.10 concurrentization: The process of making two or more devices work concurrently
31.11concurrent operation: The ability to conduct programmable device operations in two or moredevices in the same IEEE Std 1149.1-2001 chain concurrently in time. During this process, all devices in achain operate continuously in the Run-Test/ldle TAP Controller state. In particular, the burn times of thedevices can be made to elapse concurrently.
3.1.12 CRC cyclic redundant codes: This code can be used as an improved checksum process. Such a codeproperly constructed) is much less prone to aliasing a bad data stream with a good stream because itencodes the positional information of ls and 0s in a stream as well as their frequency. (See also: checksum.)
3.1.13 deterministic programming (algorithm): A device implements this algorithm when the minimumrequired burn time to satisfy programming operations is documented in the BSDL file and does not changefor like devices.Contrasf: adaptive programming.
IEEE 1532-2002 pdf download
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