IEEE 1450-1999 pdf download IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
1.1 Scope
This standard defines a test description language that:
Facilitates the transfer of large volumes of digital test vector data from CAE environments to auto-amated test equipment (ATE) environments;
Specifies pattern, format, and timing information sufficient to define the application of digital testvectors to a device under test (DUT):
Supports the volume of test vector data generated from structured tests such as scan/automatic testc1pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functionaltest specifications for IC designs and their assemblies, in a format optimized for application in ATEenvironments
In setting the scope for any standard, some issues are defined to not be pertinent to the initial project. Thefollowing is a partial list of issues that were dropped from the scope of this initial project:
Levels: A key aspect of a digital test program is the ability to establish voltage and current parameters (levels) for signals under test, Level handling is not explicitly defined in the current standard, asthis information is both compact (not presenting a transportation issue) and commonly establishedindependently of digital test data, requiring different support mechanisms outside the current scopeof this standard. Termination values may affect levels
Diagnostic/fault-tracing information: The goal of this standard is to optimally present data that needsto be moved onto ATE.While diagnostic data, fault identification data, and macro/design elementcorrespondence data can fall into this category (and is often fairly large), this standard is alsofocused on integrated circuit and assemblies test,and most debug/failure analysis occurs separatelyfrom the ATE for these structures. Note that return of failure information (for off-ATE analysis) isalso not part of the standard as currently defined.
Datalogging mechanisms, formatting, and control usually are not defined as part of this currentstandard.
Parametric tests are not defined as an integral part of this standard, except for optional pattern labelsthat identify potential locations for parametric tests, such as IpDo tests or alternating current (AC)timing tests.
Program fow: Test sequencing and ordering are not defined as part of the current standard except asnecessary to define collections of digital patterns meant to execute as a unit.
Binning constructs are not part of the current standard
Analog or mixed-signal test: While this is an area of concern for many participants, at this pointtransfer of analog test data does not contribute to the same transportation issue seen with digital data
Algorithmic pattern constructs (such as sequences commonly used for memory test) are not currentlydefined as part of the standard.
Parallel test/multisite test constructs are not an integral part of the current environmentUser input and user control/options are not part of the current standard,
Characterization tools, such as shmoo plots, are not defined as part of the current standard.
IEEE 1450-1999 pdf download
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